Abstract

Characteristics of TXRF spectrometry specific features are presented. There are formulated characteristic demands to devices comprising the TXRF facility and to objects studied by the method. TXRF spectrometry peculiarity discussion showed that the radiation density of X-ray fluorescence exciting beam is its critical parameter. In response to this criterion the planar X-ray waveguide-resonator is the best former of X-ray beam with enhanced radiation density are presented. Obtained in the work data shows that the planar extended slit clearance formed by quartz reflectors is the planar X-ray waveguide-resonator for the MoK radiation flux when the slit clearance width is smaller 110nm. There are discussed peculiarities of this device with modified constructions oriented on the MoK radiation beams formation and its application for the TXRF measurement efficiency increasing. Original TXRF investigations in the PIXE conditions are described briefly.

Keywords:X-ray radiation source; X-ray flux; X-ray beam; Total external reflection; TXRF spectrometry; X-ray beam former; Planar X-ray waveguideresonator; PXWR, Planar extended slit clearance; X-ray standing wave; Interference field; Radiation capture angle; Partial angular tunneling; Spatial intensity distribution; Radiation gathering power; Skewed concentrator; Composite planar X-ray waveguide-resonator; CPXWR; PIXE spectrometry; Partical induced total X-ray fluorescence spectrometry.